The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2013

Filed:

Apr. 26, 2011
Applicants:

Takahiro Harada, Kizugawa, JP;

Kiyoshi Ogawa, Kizugawa, JP;

Mitsutoshi Setou, Hamamatsu, JP;

Inventors:

Takahiro Harada, Kizugawa, JP;

Kiyoshi Ogawa, Kizugawa, JP;

Mitsutoshi Setou, Hamamatsu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mass spectrometer capable of obtaining a clear microscopic observation image with high spatial resolution in real time, even during a mass analysis, without affecting the analysis is provided. An apertureis formed in a stageon which a sample plateto be placed. The sample plateis transparent or translucent. A microscopic observation unit, including an observation optical systemand a CCD camera, is provided below the stageto observe the reverse side of the samplethrough the apertureof the stageas well as the transparent sample plate. The observed image is displayed on the screen of a display unit. If the sampleis a slice of biological tissue, the sample image taken from the reverse side will be substantially the same as an image taken from the obverse side.


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