The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Oct. 21, 2005
Gary T. Neel, Weston, FL (US);
Brent E. Modzelewski, Boca Raton, FL (US);
Cameron Scott Casterline, Pembroke Pines, FL (US);
George R. Rounds, Coconut Creek, FL (US);
Gary T. Neel, Weston, FL (US);
Brent E. Modzelewski, Boca Raton, FL (US);
Cameron Scott Casterline, Pembroke Pines, FL (US);
George R. Rounds, Coconut Creek, FL (US);
Nipro Diagnostics, Inc., Fort Lauderdale, FL (US);
Abstract
A system for diagnostic testing may include a meter for performing a diagnostic test on a sample applied to a test media and a container configured to contain test media compatible with the meter. The meter may include a closure portion for selectively closing the opening of the container. The system may further provide a sampling device, such as a lancet, operable connected to the container such that that a user may use the sampling device to obtain a sample without disconnecting the sampling device from the container. The system may also provide mechanisms for removing a meter from a test container and reattaching it to a new one using one of several coding methods that recalibrate the meter for the new container of test strips. In addition, the system may further provide mechanisms to reconfigure the meter to perform a new function when it has been determined that the triggering event has occurred.