The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2013

Filed:

May. 15, 2009
Applicants:

Dirk DE Bruyker, San Jose, CA (US);

Francisco E. Torres, San Jose, CA (US);

Michal V. Wolkin, Los Altos Hills, CA (US);

Gregory B. Anderson, Emerald Hills, CA (US);

Eugene M. Chow, Fremont, CA (US);

Inventors:

Dirk De Bruyker, San Jose, CA (US);

Francisco E. Torres, San Jose, CA (US);

Michal V. Wolkin, Los Altos Hills, CA (US);

Gregory B. Anderson, Emerald Hills, CA (US);

Eugene M. Chow, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/20 (2006.01); G01K 17/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nanocalorimeter includes a merging layer having, a drop placement area for holding drops to be merged and a thermal equilibration area. A measurement layer includes a substrate, and a temperature probe on the substrate, wherein the temperature probe extends out of the surface of the substrate to come into operative contact with the thermal equilibration area when the measurement layer is placed in operative association with the merging layer. The nanocalorimeter is configured to have the merging layer and the measurement layer non-integrated, making the measurement layer reusable.


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