The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Mar. 31, 2008
Harry Israel Ringermacher, Delanson, NY (US);
Donald Robert Howard, Troy, NY (US);
Bryon Edward Knight, Charlton, NY (US);
William George Patterson, Wilmington, DE (US);
Thomas Edward Bantel, Cincinnati, OH (US);
Harry Israel Ringermacher, Delanson, NY (US);
Donald Robert Howard, Troy, NY (US);
Bryon Edward Knight, Charlton, NY (US);
William George Patterson, Wilmington, DE (US);
Thomas Edward Bantel, Cincinnati, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for identifying types of flaws in a composite object includes: a) rapidly heating the surface of the object; b) recording pixel intensities in a sequence of IR images; c) determining temperature-versus-time data for each of the pixels from the IR images; and d) determining what type of flaw if any corresponds to each of the pixels using the temperature-versus-time data determined in step (c). A contrast curve derived from the temperature-versus-time data may be used in determining what type of flaws if any corresponds to each of the pixels. The contrast curve may be determined by subtracting a synthetic reference curve from a temperature time curve from the temperature-versus-time data. The types of flaws may be determined from size and/or shapes of peaks in the contrast curves. Some flaws are delaminations, layers of porosity, and uniformly distributed porosity.