The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2013

Filed:

Sep. 06, 2007
Applicants:

Michael D. Manera, Clayton, NJ (US);

Martin P. Yankowy, Broomall, PA (US);

Michael Elefante, Williamstown, NJ (US);

H. William Busch, Jr., Wilmington, DE (US);

Inventors:

Michael D. Manera, Clayton, NJ (US);

Martin P. Yankowy, Broomall, PA (US);

Michael Elefante, Williamstown, NJ (US);

H. William Busch, Jr., Wilmington, DE (US);

Assignee:

Henry Troemner LLC, Thorofare, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An orbital shaker which provides a shaking motion that is both stable and accurate to allow repeatability is provided, which allows for ease of cleaning of the shaking platform due to its mounting on a drive platform that keeps the entire drive system in an assembled state even if the shaking platform is removed for cleaning. A vibration sensor can also be provided that senses an unbalanced load on the orbital shaker and communicates with the orbital shaker controller to reduce the shaking speed in a pre-determined, trackable manner so that shaking of samples can be continued at a vibration level that is below a threshold value. Additionally, an incubating enclosure can also be provided in which a uniform heat is created throughout the entire incubating chamber in order to assure minimum temperature fluctuations between samples being processed regardless of their position on the shaking platform.


Find Patent Forward Citations

Loading…