The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Jul. 29, 2010
Applicants:
Shinji Fujita, Fujisawa, JP;
Yukitaka Murakami, Fukuoka, JP;
Inventors:
Shinji Fujita, Fujisawa, JP;
Yukitaka Murakami, Fukuoka, JP;
Assignees:
NSK Ltd., Tokyo, JP;
Kyushu University, National University Corporation, Fukuoka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
An inclusion rating method includes carrying out a tensile test on a test specimen, which is made of a metallic material and charged with a hydrogen, to cause a fracture originating from a nonmetallic inclusion affected by the hydrogen in the test specimen, identifying a type of the nonmetallic inclusion, measuring a size of the nonmetallic inclusion, and evaluating a cleanliness of the metallic material by obtaining a distribution function of the size of the nonmetallic inclusion.