The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Nov. 18, 2009
Masaki Yamano, Osaka, JP;
Masami Ikeda, Osaka, JP;
Kenji Fujiwara, Osaka, JP;
Hiroshi Kubota, Osaka, JP;
Masaki Yamano, Osaka, JP;
Masami Ikeda, Osaka, JP;
Kenji Fujiwara, Osaka, JP;
Hiroshi Kubota, Osaka, JP;
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Abstract
An ultrasonic testing apparatuscomprises an ultrasonic probeincluding n (n≧2) number of transducers arranged along a predetermined direction, disposed so as to face a test object P, and a transmission/reception control devicefor selecting m (n>m≧1) number of transducers from among the n number of transducers, transmitting ultrasonic waves from the selected m number of transducers toward the test object, receiving the ultrasonic waves therefrom, and switched m number of transducers to b selected successively. If an angle that the arrangement direction of the transducers makes with the surface of the test object which ultrasonic waves enter is θ, and the effective beam width of each selected m number of transducers with respect to a target flaw is W, the transmission/reception control device switches m number of transducers to be selected successively by a switching pitch length P satisfying the formula: P≦W·cos θ.