The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Jul. 10, 2009
Mutsumi Tanida, Osaka, JP;
Takashi Matsuura, Osaka, JP;
Yasuhisa Kasa, Wakayami, JP;
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Abstract
A dimension measuring devicein accordance with the present invention includes an end face following mechanismthat butts against an end face E of a long material, a dimension measuring mechanismfor measuring the dimensions of the long material, and a pushingly moving mechanismfor pushingly moving the end face following mechanism toward the end face of the long material. The end face following mechanism includes a plurality of contact sensors for detecting a contact state, and is turnable around two axes intersecting at right angles with each other. The pushingly moving mechanism pushingly moves the end face following mechanism into the state in which the plurality of contact sensors detect that the end face following mechanism butts against the end face of the long material. The dimension measuring mechanism is pushingly moved integrally and is turnable integrally with the end face following mechanism, and measures the dimensions of the long material when it is detected, by the plurality of contact sensors, that the end face following mechanism butts against the end face of the long material.