The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Dec. 05, 2008
Applicants:

Faris A. Sweis, Austin, TX (US);

Christopher L. Eyhorn, Austin, TX (US);

Inventors:

Faris A. Sweis, Austin, TX (US);

Christopher L. Eyhorn, Austin, TX (US);

Assignee:

ArtofTest, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems to provide automated testing of a markup software application, program product, and methods are provided. An example of a system can include a network, at least one computer including memory and a processor, and application testing program product stored in the memory of the at least one computer. The application testing program product can include instructions that when executed by the processor of the respective computer causes the respective computer to perform various operations to include receiving a user selection identifying a target element of an application; determining a command describing an action being performed; identifying a translator responsive to a captured command; and generating at least one of the following: an abstract script describing the action being performed by the target element, a context-sensitive verification available for the target element, or a context sensitive synchronization available for the target element.


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