The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Mar. 12, 2008
Applicants:

John Sidney Davis, Ii, Arlington, VA (US);

Maria Rene Ebling, White Plains, NY (US);

Chitra Venkatramani, Roslyn Heights, NY (US);

Min Wang, Cortlandt Manor, NY (US);

Inventors:

John Sidney Davis, II, Arlington, VA (US);

Maria Rene Ebling, White Plains, NY (US);

Chitra Venkatramani, Roslyn Heights, NY (US);

Min Wang, Cortlandt Manor, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for selection of a provenance dependency function in a stream-based data processing infrastructure to optimize backtracing performance in response to a provenance query includes determining performance of a set of dependency functions associated with an analysis component for determining relevancy of each input event received by the analysis component. The relevancy of each input event is determined according to each dependency function and storing a record of relevant events according to a recording method. Relevancy results of the dependency functions are aggregated, and the dependency functions are ordered according to a criterion. Data provenance is provided for a given output event using the input event recording method associated with a best dependency function according to the criterion.


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