The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Feb. 26, 2010
Applicants:

Zhan LI, Shenzhen, CN;

YE Xiong, Shenzhen, CN;

GE Zhang, Shenzhen, CN;

Inventors:

Zhan Li, Shenzhen, CN;

Ye Xiong, Shenzhen, CN;

Ge Zhang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/16 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An antenna testing device includes an analyzer, a transmission probe electrically connected to the analyzer, a receiving probe electrically connected to the analyzer, and a shielded box having a cutoff frequency. The analyzer generates a test signal the frequency of which is lower than the cutoff frequency, the transmission probe receive the test signal and sends the test signal to the shielded box. The antenna is coupled with the transmission probe and generates a coupled signal, the receiving probe receives the coupled signal and sends the coupled signal to the analyzer. The analyzer analyzes the coupled signal and the test signal, the analyzer calculates the return loss of the antenna.


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