The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2013
Filed:
Jul. 07, 2009
Gene A. Bornzin, Simi Valley, CA (US);
John W. Poore, South Pasadena, CA (US);
Richard Williamson, Santa Monica, CA (US);
Gabriel A. Mouchawar, Valencia, CA (US);
Eric S. Fain, Menlo Park, CA (US);
Gene A. Bornzin, Simi Valley, CA (US);
John W. Poore, South Pasadena, CA (US);
Richard Williamson, Santa Monica, CA (US);
Gabriel A. Mouchawar, Valencia, CA (US);
Eric S. Fain, Menlo Park, CA (US);
Pacesetter, Inc., Sylmar, CA (US);
Abstract
A method for detecting potential failures by a lead of an implantable medical device is provided. The method includes sensing a first signal over a first channel between a first combination of electrodes on the lead and sensing a second signal from a second channel between a second combination of electrodes on the lead. The method determines whether at least one of the first and second signals is representative of a potential failure in the lead and identifies a failure and the electrode associated with the failure based on which of the first and second sensed signals is representative of the potential failure. Optionally, when the first and second sensed signals are both representative of the potential failure, the method further includes determining whether the first and second sensed signals are correlated with one another. When the first and second sensed signals are correlated, the method declares an electrode common to both of the first and second combinations to be associated with the failure.