The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Mar. 18, 2011
Applicants:

Mark W. Duron, East Patchogue, NY (US);

Rehan K. Jaffri, New York, NY (US);

Richard T. Knadle, Dix Hills, NY (US);

Inventors:

Mark W. Duron, East Patchogue, NY (US);

Rehan K. Jaffri, New York, NY (US);

Richard T. Knadle, Dix Hills, NY (US);

Assignee:

Symbol Technologies, Inc., Holtsville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for providing close proximity antenna measurement and tuning, includes a first receive-only antenna, a second antenna operable in a transmit mode, a tuning circuit coupled to the first antenna, a transmitter coupled to the second antenna, a receiver coupled to the first antenna, the receiver operable to measure a power into the first antenna delivered by a signal from the second antenna driven by the transmitter, and a processor coupled to the tuning circuit, transmitter, and receiver, the processor operable to step changes in the tuning circuit until a substantially maximum power of the signal is measured by the receiver.


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