The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2013
Filed:
Nov. 11, 2009
Bernhard Biskup, Lohmar, DE;
Andreas Fischbach, Juelich, DE;
Hanno Scharr, Juelich, DE;
Forschungszentrum Juelich GmbH, Juelich, DE;
Abstract
Disclosed is a method and an apparatus for measuring the growth of leaf disks. The method comprises the following steps: a) Calibrating the capture system, b) capturing at least 2 images of a leaf disk, c) processing the image data, comprising i) segmenting the leaf disks by threshold segmentation, ii) multiple morphological erosion steps, iii) edge cleaning to remove the edge of the storage vessel, d) 3D reconstruction: generating a disparity map by means of a stereo algorithm, calculating a 3D surface model based on the previously determined calibration parameters from the disparity map, e) smoothing the previously obtained surface model, f) determining the growth rates from the time series of the areas. The apparatus comprises at least one camera, a lighting unit, a translation table in the X/Y plane for the camera and (infrared) lighting, storage vessels for leaf disks, and electronic evaluation and control units.