The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2013
Filed:
May. 25, 2012
Nathan K. Weiner, Upton, MA (US);
Patrick J. Odoy, Rowley, MA (US);
Eric Schultz, North Andover, MA (US);
Mark Jones, Reading, MA (US);
James T. Overbeck, Hingham, MA (US);
Herman Deweerd, Bedford, MA (US);
David A. Stura, North Billerica, MA (US);
Albert K. Bukys, Lexington, MA (US);
Tim J. Woolaver, Billerica, MA (US);
Thomas P. Regan, Dover, MA (US);
David Bradbury, Ipswich, MA (US);
Eric E. Mckenzie, Malden, MA (US);
Roger Dipaolo, Leominster, MA (US);
Christopher Miles, Acton, MA (US);
Joel M. Katz, Stoneham, MA (US);
Oleinik-ovod Ksenia, Newton, MA (US);
Nathan K. Weiner, Upton, MA (US);
Patrick J. Odoy, Rowley, MA (US);
Eric Schultz, North Andover, MA (US);
Mark Jones, Reading, MA (US);
James T. Overbeck, Hingham, MA (US);
Herman DeWeerd, Bedford, MA (US);
David A. Stura, North Billerica, MA (US);
Albert K. Bukys, Lexington, MA (US);
Tim J. Woolaver, Billerica, MA (US);
Thomas P. Regan, Dover, MA (US);
David Bradbury, Ipswich, MA (US);
Eric E. McKenzie, Malden, MA (US);
Roger DiPaolo, Leominster, MA (US);
Christopher Miles, Acton, MA (US);
Joel M. Katz, Stoneham, MA (US);
Oleinik-Ovod Ksenia, Newton, MA (US);
Affymetrix, Inc., Santa Clara, CA (US);
Abstract
An embodiment of a scanning system is described including optical elements that direct an excitation beam at a probe array, detectors that receive reflected intensity data responsive to the excitation beam, where the reflected intensity data is responsive to a focusing distance between an optical element and the probe array, a transport frame that adjusts the focusing distance in a direction with respect to the probe array, an auto-focuser that determines a best plane of focus based upon characteristics of the reflected intensity data of at least two focusing distances where the detectors further receive pixel intensity values based upon detected emissions from a plurality of probe features disposed on the probe array at the best plane of focus, and an image generator that associates each of the pixel intensity values with at least one image pixel position of a probe array based upon one or more position correction values.