The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Aug. 05, 2011
Applicants:

Johannes Walk, Buckenhof, DE;

Marcel Wellnitz, Heβdorf, DE;

Inventors:

Johannes Walk, Buckenhof, DE;

Marcel Wellnitz, Heβdorf, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present embodiments specify a method and an associated X-ray facility for estimating a radiation dose of an X-ray that is generated by an X-ray source and penetrates an object under examination. First dose values of the X-ray are determined by measurement in an automatic exposure control chamber. A second dose value is determined by estimating the radiation dose that is emitted by an X-ray source in a dead time of the automatic exposure control chamber. The estimated radiation dose is determined by the first dose value and the second dose value last determined being added. The second dose value represents a correction value for a non-measurable dose during the dead time of the automatic exposure control chamber that is taken into account when determining the estimated radiation dose.


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