The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Aug. 12, 2010
Applicant:

Andrey Bordenyuk, San Jose, CA (US);

Inventor:

Andrey Bordenyuk, San Jose, CA (US);

Assignee:

Photon Dynamics, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01J 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

System and method for selectively viewing features of objects, including features hidden under non-transparent materials. The system includes: illuminating light source producing illuminating light having controlled angular spectrum; homogenizing optics for spatial intensity modulation of illumination light; dephasing optics to reduce or suppress interference pattern in image due to the coherence of illumination light; infinity corrected objective directing the illuminating light on the object and collecting light from the object; illumination optical path delivering the illuminating light from the illuminating light source to infinity-corrected objective; relay optics for introducing necessary tilt angle for rays of the illuminating light entering the infinity corrected objective; adjustable iris vignetting free aperture of optical fiber; apodizing element within relay optics for spatial modulation of illumination intensity; image sensor for creating image of object; and imaging optical path for delivering light from object to image sensor, which includes tube lens, removable block and adjustable iris.


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