The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Dec. 17, 2009
Applicants:

Sheryl Woodward, Holmdel, NJ (US);

Jonathan Nagel, Brooklyn, NY (US);

Lynn Nelson, Matawan, NJ (US);

Inventors:

Sheryl Woodward, Holmdel, NJ (US);

Jonathan Nagel, Brooklyn, NY (US);

Lynn Nelson, Matawan, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); H04B 10/08 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described herein are systems and methods for enhancing the resolution of an optical time-domain reflectometer ('OTDR'). One embodiment of the disclosure of this application is related to a device, comprising an optical measuring component collecting a first set of measurement data from a forward trace along an optical fiber with the optical measuring device using depolarized light, and a processing component calculating loss along the length of fiber. The optical measuring device further collects a second set of measurement data from a backward trace along the optical fiber with the optical measuring device using depolarized light.


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