The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Jan. 21, 2009
Applicants:

Nan Sun, Cambridge, MA (US);

Donhee Ham, Cambridge, MA (US);

Inventors:

Nan Sun, Cambridge, MA (US);

Donhee Ham, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Digital background calibration in a pipelined ADC is performed by extracting a capacitor mismatch value Δ that represents a mismatch between a sampling capacitor Cand a feedback capacitor Cin the pipelined ADC, and using Δ to correct the capacitor mismatch error. Δ is extracted by performing commutated feedback capacitor switching (CFCS) in a background correlation loop. The error caused by the capacitor mismatch is calibrated out by subtracting the error from a digital output Dof the pipelined ADC. Convergence speed may be accelerated and convergence accuracy may be increased during digital background calibration of pipelined ADCs, by using a higher order LPF. A bandwidth switching scheme may be implemented by the LPF, i.e. a larger bandwidth may be utilized during calibration start-up to increase convergence speed during start-up and a smaller bandwidth may be utilized during steady state to increase convergence accuracy during steady state.


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