The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2013
Filed:
Sep. 23, 2010
Stephen Ems, Sloatsburg, NY (US);
Simon Kreymerman, Suffern, NY (US);
Peter J Pupalaikis, Ramsey, NJ (US);
Stephen Ems, Sloatsburg, NY (US);
Simon Kreymerman, Suffern, NY (US);
Peter J Pupalaikis, Ramsey, NJ (US);
Teledyne LeCroy, Inc., Thousand Oaks, CA (US);
Abstract
A system and method for performing a time domain reflectometry measurement. The system includes a coherent interleaved sampling timebase, a sampling strobe generator for generating one or more sampling strobes in accordance with the coherent interleaved sampling timebase, a time domain reflectometry sampling strobe generator for generating one or more time domain reflectometry strobes in accordance with one or more of the generated sampling strobes; and a sampling module for sampling a time domain reflectometry signal in accordance with one or more of the one or more generated sampling strobes and one or more of the one or more generated time domain reflectometry strobes. The system further includes an analog to digital converter for analog to digital converting the samples of the time domain reflectometry signal and a memory for storing the converted samples of the time domain reflectometry signal.