The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2013
Filed:
Mar. 09, 2010
Andrei Nikolaevich Matlashov, Los Alamos, NM (US);
Algis V. Urbaitis, Albuquerque, NM (US);
Igor Mykhaylovich Savukov, Los Alamos, NM (US);
Michelle A. Espy, Los Alamos, NM (US);
Petr Lvovich Volegov, Los Alamos, NM (US);
Robert Henry Kraus, Jr., Los Alamos, NM (US);
Andrei Nikolaevich Matlashov, Los Alamos, NM (US);
Algis V. Urbaitis, Albuquerque, NM (US);
Igor Mykhaylovich Savukov, Los Alamos, NM (US);
Michelle A. Espy, Los Alamos, NM (US);
Petr Lvovich Volegov, Los Alamos, NM (US);
Robert Henry Kraus, Jr., Los Alamos, NM (US);
Los Alamos National Security, LLC, Los Alamos, NM (US);
Abstract
Method comprising obtaining an NMR measurement from a sample wherein an ultra-low field NMR system probes the sample and produces the NMR measurement and wherein a sampling temperature, prepolarizing field, and measurement field are known; detecting the NMR measurement by means of inductive coils; analyzing the NMR measurement to obtain at least one measurement feature wherein the measurement feature comprises T1, T2, T1ρ, or the frequency dependence thereof; and, searching for the at least one measurement feature within a database comprising NMR reference data for at least one material to determine if the sample comprises a material of interest.