The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Oct. 27, 2008
Applicants:

Jean-michel Vignolle, St. Jean de Moirans, FR;

Thibaut Wirth, Moirans, FR;

Inventors:

Jean-Michel Vignolle, St. Jean de Moirans, FR;

Thibaut Wirth, Moirans, FR;

Assignee:

Thales, Neuilly sur Seine, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method of processing images obtained from a photosensitive detector of the type notably produced by semiconductor material deposition techniques. The method consists in correcting an image acquired by the detector with a gain image. According to the invention, a temperature gain drift correction image is applied to the acquired image as a function of a temperature measured by the detector during the acquisition of the image. The invention also relates to a photosensitive detector in which the temperature gain drift correction means are included, independently of the gain image.


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