The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Sep. 30, 2010
Applicants:

Paul James Brown, Wakefield, CA;

Alex L. Chan, Ottawa, CA;

Inventors:

Paul James Brown, Wakefield, CA;

Alex L. Chan, Ottawa, CA;

Assignee:

Alcatel Lucent, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 1/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for temperature induced warpage compensation in an integrated circuit package is disclosed. The apparatus consists of a layer of material bonded to the top of the integrated circuit package. The layer of material may have a generally planar-convex or a generally planar-concave cross-section. By appropriate choice of temperature coefficient and degree of concavity or convexity, the layer of material can compensate for either convex or concave warpage. In some embodiments the layer of material has apertures therein allowing compensation for more complex warpages. The apparatus provides an alternative to apparatus for dealing with IC package warpage known in the art.


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