The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2013
Filed:
Sep. 21, 2010
Carl E. Haugan, St. Paul, MN (US);
Timothy A. Skunes, Mahtomedi, MN (US);
Paul R. Haugen, Bloomington, MN (US);
Eric P. Rudd, Hopkins, MN (US);
Beverly Caruso, St. Louis Park, MN (US);
Steven K. Case, St. Louis Park, MN (US);
Carl E. Haugan, St. Paul, MN (US);
Timothy A. Skunes, Mahtomedi, MN (US);
Paul R. Haugen, Bloomington, MN (US);
Eric P. Rudd, Hopkins, MN (US);
CyberOptics Corporation, Golden Valley, MN (US);
Abstract
An optical inspection system and method are provided. A workpiece transport moves a workpiece in a nonstop manner. An illuminator includes a light pipe and is configured to provide a first and second strobed illumination field types. First and second arrays of cameras are arranged to provide stereoscopic imaging of the workpiece. The first array of cameras is configured to generate a first plurality of images of the workpiece with the first illumination field and a second plurality of images of the feature with the second illumination field. The second array of cameras is configured to generate a third plurality of images of the workpiece with the first illumination field and a fourth plurality of images of the feature with the second illumination field. A processing device stores at least some of the first, second, third, and fourth pluralities of images and provides the images to an other device.