The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2013
Filed:
Jan. 21, 2010
Applicants:
Okenwa Okoli, Tallahassee, FL (US);
Ben Wang, Tallahassee, FL (US);
Tarik J. Dickens, Tallahassee, FL (US);
Inventors:
Okenwa Okoli, Tallahassee, FL (US);
Ben Wang, Tallahassee, FL (US);
Tarik J. Dickens, Tallahassee, FL (US);
Assignee:
Florida State University Research Foundation, Tallahassee, FL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01J 1/58 (2006.01);
U.S. Cl.
CPC ...
Abstract
Embodiments can provide systems, methods, and apparatus for monitoring the structural health of one or more structures and associated materials. For example, a structural health monitoring system can be provided. The system can include a structure to be monitored, the structure including a material with multiple triboluminescent sensors and multiple nano-optoelectronic members; and an analyzer in signal communication with the nano-optoelectronic members.