The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2013

Filed:

Oct. 25, 2005
Applicants:

Michio Arai, Tokyo, JP;

Masashi Nishioka, Tokyo, JP;

Inventors:

Michio Arai, Tokyo, JP;

Masashi Nishioka, Tokyo, JP;

Assignee:

Hoya Corporation, Shinjuku-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 17/00 (2006.01); B23B 51/08 (2006.01); C01B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mounting part for mounting spectacle frame components such as lugs can be machined after confirming that a lens thickness at a mounting part-machined portion where the mounting part is machined is equal to or larger than the specified value, and can be installed the spectacle lens components on the spectacle lens with a requested strength. The device, the method for the above, a spectacle lens manufacturing method, and a spectacles manufacturing method are given. The spectacle lens () is fed to a lens thickness measuring device () by a lens feeder. The fed amount of the spectacle lens in this feeding is based on the measured results of a distance between a frame center forming a block center by a lens holder in an edging for manufacturing the spectacle lens () from a raw material lens and the edge face of the spectacle lens () where the mounting part is to be machined. The thickness of the lens at the mounting part-machined portion can be accurately measured by the measuring device () even if an error produced in the edging is included in the distance.


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