The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2013
Filed:
Sep. 01, 2010
Shay Artzi, Brookline, MA (US);
Julian Dolby, Bronx, NY (US);
Marco Pistoia, Amawalk, NY (US);
Frank Tip, Ridgewood, NJ (US);
Shay Artzi, Brookline, MA (US);
Julian Dolby, Bronx, NY (US);
Marco Pistoia, Amawalk, NY (US);
Frank Tip, Ridgewood, NJ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed is a novel computer implemented system, on demand service, computer program product and a method for fault-localization techniques that apply statistical analyses to execution data gathered from multiple tests. The present invention determines the fault-localization effectiveness of test suites generated according to several test-generation techniques based on combined concrete and symbolic (concolic) execution. These techniques are evaluated by applying the Ochiai fault-localization technique to generated test suites in order to localize 35 faults in four PHPWeb applications. The results show that the test-generation techniques under consideration produce test suites with similar high fault-localization effectiveness, when given a large time budget.