The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Jan. 29, 2010
Applicants:

Qingqiu Ginger Shao, Oro Valley, AZ (US);

Randy R. Magnuson, Scottsdale, AZ (US);

Dave Miller, Minneapolis, MN (US);

Bradley John Barton, Albuquerque, NM (US);

David Michael Kolbet, Scottsdale, AZ (US);

Inventors:

Qingqiu Ginger Shao, Oro Valley, AZ (US);

Randy R. Magnuson, Scottsdale, AZ (US);

Dave Miller, Minneapolis, MN (US);

Bradley John Barton, Albuquerque, NM (US);

David Michael Kolbet, Scottsdale, AZ (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting and diagnosing system faults, includes detecting the noisy status of a monitor during operations and incorporating a quantified monitor uncertainty level to support fault isolation reasoning. A sequential probability ratio test is used to statistically test the noisy status of a monitor and Shannon's entropy theory is used to quantify the uncertainty levels of the monitor to support the use of the monitor values in fault isolation.


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