The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8386804 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 26, 2013

Filed:

Feb. 11, 2009
Applicant:

Fumio Yoshiya, Tachikawa, JP;

Inventor:

Fumio Yoshiya, Tachikawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, a semiconductor integrated device which stores secret data and is capable of operating in a test mode in which a scan test with respect to an internal circuit is executed, the semiconductor integrated device comprises a mode signal receiving module configured to receive a scan mode signal designating the test mode, a mask module configured to mask the secret data when the mode signal receiving module receives the scan mode signal, and an error detection module configured to detect presence or absence of error in the secret data and to store detection result in a first flip-flop.


Find Patent Forward Citations

Yoshiya, Fumio. (2013). Semiconductor integrated device and method of testing semiconductor integrated device (U.S. Patent No. 8386804). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8386804

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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