The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Aug. 29, 2008
Applicant:

Kazuma Kozu, Tokyo, JP;

Inventor:

Kazuma Kozu, Tokyo, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

An evaluation method of a progressive-addition lens is provided. First, powers of the progressive-addition lens at a plurality of measurement points are measured to obtain an actually measured power distribution. Next, a comparison power distribution created based on the actually measured power distribution and a defective power distribution prepared in advance are compared with each other to perform similarity search between the both. Thereafter, whether or not the comparison power distribution and the defective power distribution are similar to each other is determined based on the result of the similarity search step, and if it is determined that the comparison power distribution and the defective power distribution are similar to each other, then the progressive-addition lens is evaluated as defective.


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