The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Aug. 04, 2009
Applicants:

Edward V. White, St. Charles, MO (US);

James P. Dunne, Ballwin, MO (US);

Inventors:

Edward V. White, St. Charles, MO (US);

James P. Dunne, Ballwin, MO (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Int. Cl.
CPC ...
G01M 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are provided for detecting an anomaly in a hidden portion of a first layer of a multi-layer structure. A monitoring element is provided on at least one exposed end of a fastener that extends through the multi-layer structure, and another monitoring element on an exposed portion of the first layer. With at least one of the monitoring elements, an inspection signal is introduced into the multi-layer structure including the hidden portion of the first layer. The inspection signal is then sensed with at least another one of the monitoring elements following propagation of the inspection signal through at least a portion of the multi-layer structure including the hidden portion of the first layer. Finally, an anomaly may be detected in the hidden portion of the first layer based upon the inspection signal that has been sensed.


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