The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Apr. 13, 2007
Applicants:

Jiang Du, San Diego, CA (US);

Mark Bydder, San Diego, CA (US);

Graeme M. Bydder, San Diego, CA (US);

Inventors:

Jiang Du, San Diego, CA (US);

Mark Bydder, San Diego, CA (US);

Graeme M. Bydder, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, systems and computer program products of magnetic resonance imaging (MRI) using ultra short echo times and spiral sampling in k-space are disclosed. A long inversion radio frequency (RF) pulse that inverts magnetization of long Tcomponents are applied to a sample that exhibits long transverse relaxation time (T) components and short Tcomponents to minimize signals corresponding to the long Tcomponents. In addition, half RF excitation pulses are applied to the sample to select one or more echo times. Data corresponding to the selected one or more echo times are acquired using a spiral trajectory, and a first echo image is obtained based on the acquired data.


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