The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2013
Filed:
May. 20, 2004
Shahbaz Nazrul, Poway, CA (US);
Suhas A. Pai, San Diego, CA (US);
Zhilin Liu, San Diego, CA (US);
Amit Gil, San Diego, CA (US);
Daehak Kim, San Diego, CA (US);
Gopal Agarwal, San Diego, CA (US);
Shahbaz Nazrul, Poway, CA (US);
Suhas A. Pai, San Diego, CA (US);
Zhilin Liu, San Diego, CA (US);
Amit Gil, San Diego, CA (US);
Daehak Kim, San Diego, CA (US);
Gopal Agarwal, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A test system emulates the analog processing portion of a communication device and adjusts input signals based on distortions specified by a user and control signals generated by a baseband processing portion of the communication device. The distortions can be specified in terms of the baseband. One or more of the control signals can be bypassed to investigate the effect of each of the control signals alone, or in various combinations. An operator interface can be provided that allows the user to set up and conduct the tests, and monitor the results. Facilities are also provided to allow the reference voltage at the baseband processing portion to be adjusted while maintaining the appropriate reference voltage for components in the test system.