The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Mar. 03, 2008
Applicants:

Katsuaki Abe, Cupertino, CA (US);

Yoshifumi Hosokawa, Osaka, JP;

Yasuyuki Naito, Osaka, JP;

Kentaro Miyano, Osaka, JP;

Noriaki Saito, Tokyo, JP;

Inventors:

Katsuaki Abe, Cupertino, CA (US);

Yoshifumi Hosokawa, Osaka, JP;

Yasuyuki Naito, Osaka, JP;

Kentaro Miyano, Osaka, JP;

Noriaki Saito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a direct sampling circuit and a receiver using a discrete time analog process and having a filter effect of a steep attenuation characteristic in a narrow-pass band without lowering a sampling rate. In a discrete time direct sampling circuit (), the positive phase side and the inverse phase side are both sampled by a local signal for a differential current output of a differential voltage/current conversion unit () and electric charge is accumulated in a charge sampling capacitor. The latest accumulated charge at the positive phase side and charge accumulated at the inverse phase side before a predetermined number of samples are combined with the charge accumulated in a history capacitor () in the past. Thus, it is possible to realize equivalently high-degree FIR filter characteristic.


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