The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8385714 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 26, 2013

Filed:

Jun. 16, 2011
Applicants:

William J Cummings, Clinton, WA (US);

Brian J Gally, Los Gatos, CA (US);

Inventors:

William J Cummings, Clinton, WA (US);

Brian J Gally, Los Gatos, CA (US);

Assignee:

QUALCOMM MEMS Technologies, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/00 (2006.01); G02F 1/035 (2006.01); G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is provided for visual inspection of an array of interferometric modulators in various driven states. This method may include driving multiple columns or rows of interferometric modulators via a single test pad or test lead, such as test pad, and then observing the array for discrepancies between the expected optical output and the actual optical output of the array. This method may particularly include, for example, driving a set of non-adjacent rows or columns to a state different from the intervening rows or columns and then observing the optical output of the array.


Find Patent Forward Citations

Cummings, William. (2013). Methods for visually inspecting interferometric modulators for defects (U.S. Patent No. 8385714). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8385714

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