The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2013
Filed:
Nov. 27, 2009
Miguel Berg, Upplands Väsby, SE;
Daniel Cederholm, Solna, SE;
Klas Ericson, Älvsjö, SE;
Per Ola Börjesson, Lund, SE;
Miguel Berg, Upplands Väsby, SE;
Daniel Cederholm, Solna, SE;
Klas Ericson, Älvsjö, SE;
Per Ola Börjesson, Lund, SE;
Telefonaktiebolaget L M Ericsson (publ), Stockholm, SE;
Abstract
A FDR SELT measurement is made in a stop band of a DSL band plan, using a PSD allowed by the PSD mask. Further measurements may also be made in an adjacent pass band and further bands, and the results combined to create a wide-band measurement result. When transformed into the time domain (e.g. by inverse Fourier transform to produce the line impulse response) greater resolution in time (and hence greater spatial resolution) is achieved. In order to compensate for AGC calibration errors measurements using different AGC steps may be scaled to fit smoothly to each other. If measurements overlap, measurement results in the region of overlap may be combined in various ways to limit the influence of noise and to create a smooth transition from one measurement to the next.