The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2013
Filed:
Jun. 25, 2010
Hyun-soo Park, Seoul, KR;
Jae-wook Lee, Osan-si, KR;
Jae-seong Shim, Seoul, KR;
Jung-hyun Lee, Seoul, KR;
Eing-seob Cho, Yongin-si, KR;
Eun-jin Ryu, Suwon-si, KR;
Hyun-soo Park, Seoul, KR;
Jae-wook Lee, Osan-si, KR;
Jae-seong Shim, Seoul, KR;
Jung-hyun Lee, Seoul, KR;
Eing-seob Cho, Yongin-si, KR;
Eun-jin Ryu, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method of determining characteristics of a signal and an apparatus using the method. The apparatus for determining characteristics of a signal includes: a level detector receiving sample values of a radio frequency (RF) signal and binary data obtained by binarizing the RF signal, generating selection signals based on the binary data, classifying each of the sample values of the RF signal into one of a plurality of levels using the selection signals, and outputting average values of sample values of each level; and a signal characteristics determiner determining a characteristics value that indicates the characteristics of the RF signal using the average values of the sample values belonging to each level.