The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Jun. 24, 2010
Applicant:

Wei Liu, San Ramon, CA (US);

Inventor:

Wei Liu, San Ramon, CA (US);

Assignee:

Chevron U.S.A. Inc., San Ramon, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Images relating to a subsurface region may be generated based at least in part on a backward propagated source wavefield and a receiver wavefield. A source wavefield may be propagated from an initial wavefield-state forward in time, from an initial time-state to a final time-state, through an earth model associated with the subsurface region. The backward propagated source wavefield may be determined by propagating the source wavefield backward in time, from the final time-state to the initial time-state, through the earth model to reconstruct the initial wavefield-state. The receiver wavefield may be propagated, from the final time-state, through the earth model. The earth model may include at least one boundary region that can be defined as having one or more of absorbing characteristics, boosting characteristics, randomly perturbed characteristics, and/or other characteristics. As such, wavefields may be dampened, amplified, randomly scattered, and/or otherwise altered at the at least one boundary region. These wavefields may be used for constructing images of subsurface regions with improved signal-to-noise ratios.


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