The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Apr. 23, 2009
Applicants:

Kazumi Mizukami, Tokyo, JP;

Kenichi Murakami, Tokyo, JP;

Satoshi Arai, Tokyo, JP;

Nobusato Morishige, Tokyo, JP;

Yuji Kubo, Tokyo, JP;

Hotaka Honma, Tokyo, JP;

Eiichi Nanba, Tokyo, JP;

Inventors:

Kazumi Mizukami, Tokyo, JP;

Kenichi Murakami, Tokyo, JP;

Satoshi Arai, Tokyo, JP;

Nobusato Morishige, Tokyo, JP;

Yuji Kubo, Tokyo, JP;

Hotaka Honma, Tokyo, JP;

Eiichi Nanba, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method according to the present invention has: isolating, by extraction, particles contained in a metal material to be analyzed in a solution using a particle isolator; dispersing the particles isolated by extraction into a solvent to prepare a dispersion, and fractionating the dispersion into a plurality of particle dispersions based on particle sizes, using a field flow fractionator; and irradiating laser light on each of the particle dispersions separated based on predetermined particle sizes, to thereby measure absolute values of the particle size based on angular dependence of reflection intensity, and also to thereby measure the number density based on magnitude of reflection intensity.


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