The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Apr. 13, 2009
Applicants:

Charles Loop, Mercer Island, WA (US);

Christian Eisenacher, Erlangen, DE;

Quirin Meyer, Erlangen, DE;

Inventors:

Charles Loop, Mercer Island, WA (US);

Christian Eisenacher, Erlangen, DE;

Quirin Meyer, Erlangen, DE;

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Views of parametric surfaces are rendered. A set of parametric surface patches representing a parametric surface being rendered is projected onto a scene, producing a set of view-projected surface patches. Each view-projected surface patch is identified for either culling, subdivision or rendering. For patches which are identified for subdivision, the patches are recursively subdivided into sub-patches until for each sub-patch a prescribed screen-space projection of the sub-patch satisfies a prescribed screen-space error metric. Once the error metric is satisfied, the sub-patch is identified for rendering. Patches and sub-patches which have been identified for rendering are prepared and rendered.


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