The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2013
Filed:
Apr. 20, 2011
Koji Shimazawa, Tokyo, JP;
Ryo Hosoi, Tokyo, JP;
Yasuhiro Ito, Tokyo, JP;
Masaaki Kaneko, Tokyo, JP;
Takashi Honda, Hong Kong, HK;
Ryuji Fujii, Hong Kong, HK;
Koji Hosaka, Hong Kong, HK;
Koji Shimazawa, Tokyo, JP;
Ryo Hosoi, Tokyo, JP;
Yasuhiro Ito, Tokyo, JP;
Masaaki Kaneko, Tokyo, JP;
Takashi Honda, Hong Kong, HK;
Ryuji Fujii, Hong Kong, HK;
Koji Hosaka, Hong Kong, HK;
TDK Corporation, Tokyo, JP;
Abstract
A method of the invention for performing burn-in test includes assembling, on a fixture stand, a plurality of light source elements and a plurality of light detectors for monitoring a light output from a corresponding one of the plurality of light source elements; and electrifying the plurality of light source elements in a state where at least the plurality of light source elements and the plurality of light detectors are immersed in an insulation liquid. Thereby, it is realized to hold a stable temperature in a short period of time, to maintain a temperature that does not deviate from normal load conditions, and to perform a sorting test between defect parts and good part for light source unit chips without causing damage to the elements.