The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2013
Filed:
Oct. 05, 2009
Herbert W. Behlow, Jr., Greenville, SC (US);
Bevan C. Elliott, Greenville, SC (US);
Gayatri D. Keskar, Stamford, CT (US);
Doyl E. Dickel, Central, SC (US);
Malcolm J. Skove, Clemson, SC (US);
Apparao M. Rao, Anderson, SC (US);
Herbert W. Behlow, Jr., Greenville, SC (US);
Bevan C. Elliott, Greenville, SC (US);
Gayatri D. Keskar, Stamford, CT (US);
Doyl E. Dickel, Central, SC (US);
Malcolm J. Skove, Clemson, SC (US);
Apparao M. Rao, Anderson, SC (US);
Clemson University, Clemson, SC (US);
Abstract
A method and system is disclosed to detect and analyze an electric signal based on movement between an element and a counter electrode influenced by a nonlinear electric field produced by an electrical signal impressed between the element and counter electrode. Through detection of changes in the distance between the element and the counter electrode characteristics of the element and/or the environment of the element may be ascertained. Changes in the distance between the element and the counter electrode may be monitored based on changes in the value of capacitance between the element and counter electrode. The disclosed devices and methods may be employed to detect, for instance, presence of chemical/biological species in a sample or measure physical parameters of a sample such as pressure/acceleration, density, viscosity, magnetic force, temperature, and/or extremely small masses.