The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Sep. 11, 2009
Applicants:

Mehmet Aykac, Knoxville, TN (US);

Mark Musrock, Oak Ridge, TN (US);

Carlyle L. Reynolds, Acworth, GA (US);

Inventors:

Mehmet Aykac, Knoxville, TN (US);

Mark Musrock, Oak Ridge, TN (US);

Carlyle L. Reynolds, Acworth, GA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, disclosure relates to for improving detection of true coincidence events and differentiating them from events detected from scattered and random gamma photons, comprises receiving electromagnetic radiation at a plurality of photo detectors that was generated by a scintillating crystal impacted by a gamma photon, and processing data received at a subset of the plurality of photo detectors that are closer to a scintillating crystal, thereby improving a timing coincidence window for detecting a coincidence event.


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