The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2013
Filed:
Jan. 17, 2006
Atsushi Yanagida, Tokyo, JP;
Takashi Kurihara, Tokyo, JP;
Hiroyuki Yokoi, Tokyo, JP;
Atsushi Koyata, Tokyo, JP;
Yoshikazu Okamura, Tokyo, JP;
Daishi Miyamoto, Tokyo, JP;
Atsushi Yanagida, Tokyo, JP;
Takashi Kurihara, Tokyo, JP;
Hiroyuki Yokoi, Tokyo, JP;
Atsushi Koyata, Tokyo, JP;
Yoshikazu Okamura, Tokyo, JP;
Daishi Miyamoto, Tokyo, JP;
Mitsubishi Chemical Medience Corporation, Tokyo, JP;
Abstract
An object of the present invention is to provide a cartridge for automatic measurement used in an automatic measuring device, capable of automatically performing measurement including heat treatment of a sample, and a measuring device using the cartridge. The present invention relates to a cartridge for use in measuring a component to be measured contained in a sample, comprising: at least a heat-treatment well for performing heat treatment of the sample; and a reaction well for reacting the component to be measured in the sample with a material specifically reacting therewith.