The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Nov. 03, 2009
Applicants:

Kersten Wehmeier, Ludwigsburg, DE;

Michael Fey, Wiernsheim, DE;

Andreas Koring, Reutlingen, DE;

Inventors:

Kersten Wehmeier, Ludwigsburg, DE;

Michael Fey, Wiernsheim, DE;

Andreas Koring, Reutlingen, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 15/10 (2006.01); F02D 41/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A procedure for detecting manipulations at lambda comprises the following steps; the lambda probe is excited by at least one electric excitation signal; at least one electric response signal of the probe is detected; the at least one response signal is compared to at least one default electric response signal that characterizes a not manipulated probe; the deviation of the detected at least one electric response signal from the at least one default electric response signal is used for detecting a manipulation of the probe. A device for detecting manipulations at lambda probes characterized by a switch assembly, with which the probe can be impinged with an electric excitation signal, in particular a step-wise electric excitation, preferably with a current impulse, by a evaluation switch device for evaluating a response signal, in particular the probe voltage and for comparing the excitation signal with the response signal and for assuming a manipulation in the case of a deviation of the response signal from a response signal that characterizes a not manipulated probe.


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