The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2013
Filed:
Feb. 28, 2007
Takashi Igarashi, Akishima, JP;
Masahiro Jinbo, Akirono, JP;
Ryousuke Satoh, Koganei, JP;
Hoya Corporation, Tokyo, JP;
Abstract
To provide a calibration jig which can perform three-dimensional calibration of measurement errors in a spectacle frame shape measuring apparatus. The calibration jig is used for calibrating measurement errors of the spectacle frame shape measuring apparatus for measuring a shape of a spectacle frame, etc. A trace groove traced by a measuring probe of the spectacle frame shape measuring apparatus is a frame groove formed in an inner circumference of rims of the spectacle frame and provided for engaging with the bevel of a spectacle lens. The rims are secured to a frame body having rigidity higher than that of the rim. The frame groove has a displacement r in the radial direction, a displacement θ in the rotational direction, and a displacement z in the height direction.