The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2013

Filed:

Oct. 13, 2010
Applicants:

Shengyang Dai, San Jose, CA (US);

Su Wang, San Jose, CA (US);

Akira Nakamura, San Jose, CA (US);

Takeshi Ohashi, Kanagawa, JP;

Jun Yokono, Tokyo, JP;

Inventors:

Shengyang Dai, San Jose, CA (US);

Su Wang, San Jose, CA (US);

Akira Nakamura, San Jose, CA (US);

Takeshi Ohashi, Kanagawa, JP;

Jun Yokono, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for implementing a multi-label image recognition framework for classifying digital images are provided. The provided multi-label image recognition framework utilizes an iterative, multiple analysis path approach to model training and image classification tasks. A first iteration of the multi-label image recognition framework generates confidence maps for each label, which are shared by the multiple analysis paths to update the confidence maps in subsequent iterations. The provided multi-label image recognition framework permits model training and image classification tasks to be performed more accurately than conventional single-label image recognition frameworks.


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