The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2013
Filed:
Jul. 02, 2010
Applicant:
Chi-de Chen, Taipei, TW;
Inventor:
Chi-De Chen, Taipei, TW;
Assignee:
Ability Enterprise Co., Ltd., Taipei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of determining shift between two images is disclosed. A first array of pixel data of a first image is mapped to a first feature array(s) having a dimension lesser than the first array, and a second array of pixel data of a second image is mapped to a second feature array(s) having a dimension lesser than the second array. The second feature array is aligned with the first feature array by determining similarity between the first feature array and a number of the shifted second feature arrays. The position shift of the shifted second feature array with most similarity is thus determined as the shift between the two images.