The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2013

Filed:

Aug. 03, 2009
Applicant:

Munenori Fukunishi, Kunitachi, JP;

Inventor:

Munenori Fukunishi, Kunitachi, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A motion vector measurement condition setting unit determines a measurement precision, which is used when measuring a motion vector between a plurality of images, on the basis of information indicating a distortion in an optical system and sets a plurality of motion vector measurement regions in which the motion vector is to be measured on an image. A motion vector calculation unit determines the motion vector between the plurality of images in each of the plurality of motion vector measurement regions at the determined measurement precision. A motion vector integration processing unit determines a positional displacement amount between the plurality of images on the basis of the motion vector determined in each of the plurality of motion vector measurement regions.


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