The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2013
Filed:
Oct. 05, 2009
Peter Forthmann, Sandesneben, DE;
Thomas Koehler, Norderstedt, DE;
Udo Van Stevendaal, Ahrensburg, DE;
Matthias Bertram, Aachen, DE;
Steffen Wiesner, Cologne, DE;
Colas Schretter, Grez-Doiceau, BE;
Peter Forthmann, Sandesneben, DE;
Thomas Koehler, Norderstedt, DE;
Udo Van Stevendaal, Ahrensburg, DE;
Matthias Bertram, Aachen, DE;
Steffen Wiesner, Cologne, DE;
Colas Schretter, Grez-Doiceau, BE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
A method and apparatus are provided to improve CT image acquisition using a displaced acquisition geometry. A CT apparatus may be used having a source () and a detector () transversely displaced from a center () of a field of view () during acquisition of the projection data. The amount of transverse displacement may be determined based on the size of the object (). The source and the detector may be adjusted to vary the size of the transverse field of view. The first data set acquired by the detector may be reconstructed and used to simulate missing projection data that could not be acquired by the detector at each projection angle. The measured projection data and the simulated projection data may be used to obtain a second data set. The second data set may be compared to the first data set to produce a corrected data set.